List of Board Types PDSI can supply
| Test Type | Test Condition | Ovens Supported | JEDEC & MIL standard | Image |
|---|---|---|---|---|
| HTOL | High Temperature Operating Life 1000 Hours @ 125C (Dynamic/Static) | Adec / Rel-Inc / Incal / Aher Test / MCC /Wakefiled / Jarvis / Marin | ‎JESD22-108, JESDS85 MIL-STD-883C |  |
| HAST/BHAST | Highly Accelerated Temperature/Humidity Stress Test (96 Hours @ 130C/85%RH) | Hirayama / Express Test | JESD22-A110D |  |
| THBT | Temperature Humidity Bias Test (1000 Hours @ 85C/85% RH) | Marin 6/10 & others | JESD22-A101C | |
| ELFR | Early Life Failure Rate | Adec 92 & others | JESD22-A108, JESD74 |  |
| LTOL | Low Temperature Operating Life | Adec 92 & others | JESD22-A108 | |
| PTC / PRCL | Power and Temperature Cycling | Adec / Aher12000 & others | JESD22-A105C |  |
| Radiation | Environmental Test Methods for Semiconductor Devices TM 1017: Neutron irradiation TM 1019: Steady-state total dose irradiation procedure TM 1080: SEB and SEGR | Custom Fixtures | MIL-STD-883 TM1019.8 | |
| Drop Test | Drop Test QFN, CSP, uBGA | JESD22-B111 test methodology | ||
| PCA | Package Conversion Adapters |  |
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| Signal Driver Boards | Universal / Dedicated Driver Cards | Various Oven Types |  |
|
| SCA | Socket Card Adapter | Used in Universal Design Approach |  |
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| Program Cards | Universal & Dedicated Program Cards | Used in Universal Design Approach | ||
| UBIB | Universal Burn-in Boards | Various Oven Types | ||
| Test Load Boards | Dedicated Test Load Boards | Various Test Systems |  |
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| Handler Interface Boards | Dedicated Interface Boards | Various Handlers |  |